The metrics of the 2-dimensional (x and y axis) pixel sampling surface.
spatialMetrics has the following components:
Subelements:
samplingFrequencyPlane
samplingFrequencyUnit
xSamplingFrequency
ySamplingFrequency
Repeatable
N
Name
samplingFrequencyPlane
Label
Spatial Metrics - Sampling Frequency Plane
Schema
NISO MIX
Definition
A data element that designates the reference plane location for which xSamplingFrequency and ySamplingFrequency are designated.
Usage Note
1 (camera/scanner focal plane) is difficult to determine without knowledge of the physical sensor sampling frequency. 2 (object plane) is the default value and is used when the source and digital object have the same object plane. 3 (source object plane) is frequently used for intermediaries, such as microfilm where the sampling frequencies for x and y would be for the source object rather than the film intermediary.
Unit of Measurement for the subelements xSamplingFrequency and ySamplingFrequency.
Usage Note
1 (no absolute unit of measurement) is used for images with a non-square aspect ratio but no meaningful absolute dimensions or when source measurements are unknown, because of an intermediary format, such as 35 mm negative film.
Controlled Vocabulary
1 (no absolute unit of measurement); 2 (inch); 3 (centimeter)
Repeatable
N
Name
xSamplingFrequency
Label
Spatial Metrics - Sampling Frequency (x)
Schema
NISO MIX
Definition
Number of pixels per SamplingFrequencyUnit in the image width.
Controlled Vocabulary
free-text; positive integer
Repeatable
N
Name
ySamplingFrequency
Label
Spatial Metrics - Sampling Frequency (y)
Schema
NISO MIX
Definition
Number of pixels per SamplingFrequencyUnit in the image length.
Statistical Profile