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Novel flip-flop designs tolerant to soft-errors and crosstalk effects

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TitleInfo (displayLabel = Citation Title); (type = uniform)
Title
Novel flip-flop designs tolerant to soft-errors and crosstalk effects
Name (ID = NAME001); (type = personal)
NamePart (type = family)
Jagirdar
NamePart (type = given)
Aditya
DisplayForm
Aditya Jagirdar
Role
RoleTerm (authority = RULIB)
author
Name (ID = NAME002); (type = personal)
NamePart (type = family)
Bushnell
NamePart (type = given)
Michael
Affiliation
Advisory Committee
DisplayForm
Michael Lee Bushnell
Role
RoleTerm (authority = RULIB)
chair
Name (ID = NAME003); (type = personal)
NamePart (type = family)
Parashar
NamePart (type = given)
Manish
Affiliation
Advisory Committee
DisplayForm
Manish Parashar
Role
RoleTerm (authority = RULIB)
internal member
Name (ID = NAME004); (type = personal)
NamePart (type = family)
Sheng
NamePart (type = given)
Kuang
Affiliation
Advisory Committee
DisplayForm
Kuang Sheng
Role
RoleTerm (authority = RULIB)
internal member
Name (ID = NAME005); (type = personal)
NamePart (type = family)
Chakraborty
NamePart (type = given)
Tapan
Affiliation
Advisory Committee
DisplayForm
Tapan Jyoti Chakraborty
Role
RoleTerm (authority = RULIB)
outside member
Name (ID = NAME006); (type = corporate)
NamePart
Rutgers University
Role
RoleTerm (authority = RULIB)
degree grantor
Name (ID = NAME007); (type = corporate)
NamePart
Graduate School - New Brunswick
Role
RoleTerm (authority = RULIB)
school
TypeOfResource
Text
Genre (authority = marcgt)
theses
OriginInfo
DateCreated (qualifier = exact)
2007
DateOther (qualifier = exact); (type = degree)
2007
Language
LanguageTerm
English
PhysicalDescription
Form (authority = marcform)
electronic
InternetMediaType
application/pdf
InternetMediaType
text/xml
Extent
x, 49 pages
Abstract
The desire to make technology faster, smaller and more affordable compels us to shrink transistors further. As we realize designs with millions of transistors, most of the existing problems increase in severity and newer problems crop up. One major new problem is Soft-Errors in logic and the result is a severe decrease in circuit reliability. This problem has been common in static memories since 1970 and, hence, fault-tolerant memory techniques are well developed. However, soft-errors today affect sequential logic as well. Interconnect crosstalk gets severe as we move towards higher operational frequencies and must be dealt in conjunction with soft-errors. In this work, we propose novel flip-flop designs, which, unlike previous designs, are immune to soft-errors and crosstalk effects during the entire Window of Vulnerability (WoV), even around the clock edge. The Crosstalk and Soft-Error Tolerant Flip-Flop (XSEUFF2) can recover from transient pulses generated in the combinational logic and on internal nodes of the master and slave latches. It is also tolerant to any signal delays arising due to crosstalk. The area, timing and power overheads of this design over Mitra's Basic Scan Flip-Flop (BSFF) are 37%, 30% and 250% while those of Mitra's Error Blocking Scan Flip-Flop (EBSFF) and Error Trapping Scan Flip-Flop (ETSFF) are 13%, 23%, 213%, 15%, 5% and 226%. The area overhead of Roy's Error Blocking Scan Hold Flip-Flop (EBSHFF) is 9% lower than that of BSFF, while the timing and power penalties are 25% and 72%, respectively. Designs of the EBSFF, ETSFF and EBSHFF are vulnerable to soft-errors affecting the master latch around the active clock edge and hence, do not provide total immunity from soft-errors, particularly around the active clock edge. Further, they are not tolerant to crosstalk effects. We also calculate overheads for more ISCAS '89 benchmark circuits and the average overhead of the XSEUFF2 is about 20%. Thus, with reasonable increase in area, timing and power penalties we design a flip-flop completely tolerant to soft-errors and crosstalk. In conjunction with the XSEUFF2, we also propose the Crosstalk Tolerant Flip-Flop (XTFF) and the XTFF2 that are immune to only crosstalk effects and incoming transients from combinational logic. They have much lower overheads and have a different level of trade-off between reliability and performance.
Note (type = degree)
M.S.
Note (type = bibliography)
Includes bibliographical references (p. 44-49).
Subject (ID = SUBJ1); (authority = RUETD)
Topic
Electrical and Computer Engineering
Subject (ID = SUBJ2); (authority = ETD-LCSH)
Topic
Integrated circuits--Design and construction
Subject (ID = SUBJ3); (authority = ETD-LCSH)
Topic
Electronic circuits
Subject (ID = SUBJ4); (authority = ETD-LCSH)
Topic
Crosstalk
RelatedItem (type = host)
TitleInfo
Title
Graduate School - New Brunswick Electronic Theses and Dissertations
Identifier (type = local)
rucore19991600001
Identifier (type = hdl)
http://hdl.rutgers.edu/1782.2/rucore10001600001.ETD.16402
Identifier
ETD_534
Location
PhysicalLocation (authority = marcorg); (displayLabel = Rutgers, The State University of New Jersey)
NjNbRU
Identifier (type = doi)
doi:10.7282/T3SQ90TN
Genre (authority = ExL-Esploro)
ETD graduate
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RightsDeclaration (AUTHORITY = GS); (ID = rulibRdec0006)
The author owns the copyright to this work.
Copyright
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Availability
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Open
AssociatedEntity (AUTHORITY = rulib); (ID = 1)
Name
Aditya Jagirdar
Role
Copyright holder
Affiliation
Rutgers University. Graduate School - New Brunswick
RightsEvent (AUTHORITY = rulib); (ID = 1)
Type
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Detail
Non-exclusive ETD license
AssociatedObject (AUTHORITY = rulib); (ID = 1)
Type
License
Name
Author Agreement License
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I hereby grant to the Rutgers University Libraries and to my school the non-exclusive right to archive, reproduce and distribute my thesis or dissertation, in whole or in part, and/or my abstract, in whole or in part, in and from an electronic format, subject to the release date subsequently stipulated in this submittal form and approved by my school. I represent and stipulate that the thesis or dissertation and its abstract are my original work, that they do not infringe or violate any rights of others, and that I make these grants as the sole owner of the rights to my thesis or dissertation and its abstract. I represent that I have obtained written permissions, when necessary, from the owner(s) of each third party copyrighted matter to be included in my thesis or dissertation and will supply copies of such upon request by my school. I acknowledge that RU ETD and my school will not distribute my thesis or dissertation or its abstract if, in their reasonable judgment, they believe all such rights have not been secured. I acknowledge that I retain ownership rights to the copyright of my work. I also retain the right to use all or part of this thesis or dissertation in future works, such as articles or books.
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Format (TYPE = mime); (VERSION = )
application/x-tar
FileSize (UNIT = bytes)
1054720
Checksum (METHOD = SHA1)
ae6e9ffa5ccdc77b832cf8dc4d6223975737cccd
ContentModel
ETD
CompressionScheme
other
OperatingSystem (VERSION = 5.1)
windows xp
Format (TYPE = mime); (VERSION = NULL)
application/x-tar
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