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Nondestructive evaluation of residual stresses in nanostructured coatings by synchotron radiation
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Ahmedi, Nazia Ikram. Nondestructive evaluation of residual stresses in nanostructured coatings by synchotron radiation. Retrieved from https://doi.org/doi:10.7282/T3Q240D6

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TitleNondestructive evaluation of residual stresses in nanostructured coatings by synchotron radiation
NameAhmedi, Nazia Ikram (author); Baruh, Haim (chair); Tsakalakos, Thomas (co-chair); Tse, Stephen (internal member); Rutgers University; Graduate School - New Brunswick
Date Created
Other Date2010-01 (degree)
SubjectMechanical and Aerospace Engineering, Residual stresses--Measurement, Nanostructured materials, Coatings
Extentix, 50 p. : ill.
DescriptionThis thesis presents a strain mapping in nanostructure Al2O3/TiO2 ceramic coatings on metallic Titanium substrates by synchrotron radiation. The mapping is obtained under various boundary conditions (tension/compression loads, four-point bending, etc.) and is accomplished using high energy (deeply penetrating) synchrotron white radiation with photon energies up to 200 keV to perform high precision x-ray diffraction on small volumes (1 µm to a few cm), which are then integrated into high resolution 3D maps of the strain fields. Strain mapping in conventional micro-size ceramic coatings are performed for comparison. The underlining structural and functional parameters in processing of these coatings, which result in dramatic improvements in their performance, are discussed. The thesis also presents mechanical properties such as elastic modulus, yield strength, etc., which are deduced from energy dispersive X-ray diffraction (EDXRD) strain mapping in conjunction with modeling.
NoteM.S.
NoteIncludes bibliographical references
Noteby Nazia Ikram Ahmedi
Genretheses, ETD graduate
Persistent URLhttps://doi.org/doi:10.7282/T3Q240D6
Languageeng
CollectionGraduate School - New Brunswick Electronic Theses and Dissertations
Organization NameRutgers, The State University of New Jersey
RightsThe author owns the copyright to this work.
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