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Information theoretic and spectral methods of test point, partial-scan and full-scan flip-flop insertion to improve integrated circuit testability
Descriptive
TypeOfResource
Text
TitleInfo
(ID = T-1)
Title
Information theoretic and spectral methods of test point, partial-scan and full-scan flip-flop insertion to improve integrated circuit testability
SubTitle
PartName
PartNumber
NonSort
Identifier
(displayLabel = );
(invalid = )
ETD_2146
Identifier
(type = hdl)
http://hdl.rutgers.edu/1782.2/rucore10001600001.ETD.000052257
Language
(objectPart = )
LanguageTerm
(authority = ISO639-2);
(type = code)
eng
Genre
(authority = marcgt)
theses
Subject
(ID = SBJ-1);
(authority = RUETD)
Topic
Electrical and Computer Engineering
Subject
(ID = SBJ-2);
(authority = ETD-LCSH)
Topic
Integrated circuits
Subject
(ID = SBJ-3);
(authority = ETD-LCSH)
Topic
Integrated circuits--Testing
Abstract
We present a radically new design for testability (DFT) algorithm, which inserts test points (TPs) and scanned flip-flops (SFFs) into large circuits to make them testable. The algorithm measures testability using Shannon's entropy measure (from information theory), which will be shown to be a vastly superior way to measure testability, and spectral co-efficients. The spectral measures are superior in measuring fault coverage (FC) improvement. The algorithm can determine the DFT candidates using a gradient descent method or using an integer linear program (ILP). The optimal insertion of the TPs and SFFs reduces the amount of DFT hardware, since the algorithm trades off inserting a TP versus inserting a SFF. Various other derived measures are used and found to be effective in making the circuit testability better at various stages. The integer linear program finds the optimal solution to the optimization, and the testability measures are used to maximize information flow through the circuit-under-test (CUT). The result, on full-scan designs with test points, is a 40.05% reduction in test volume (TV) and a 54.24% reduction in test application time (TAT), compared to a full-scan design without test points. The method, used in conjunction with the Synopsys TetraMAX™ automatic test pattern generator (ATPG), achieves 1.55% higher FC and 100% fault efficiency (FE) on ITC ’99 benchmark circuits compared to conventional methods and reduces the ATPG time by 90.24%. The method works better than all prior methods on partial-scan circuits, as well. We achieve TV reductions of 19.56% and 33.42% and TAT reductions of 21.63% and 31.23%, over the previous best SPARTAN PS+TP1 and PS+TP2 partial scan ideas, respectively, on ISCAS '89 benchmark circuits. We also get 32.62% TV reduction and 25.39% TAT reduction over the mpscan algorithm.
PhysicalDescription
Form
(authority = gmd)
electronic resource
Extent
xiii, 133 p. : ill.
InternetMediaType
application/pdf
InternetMediaType
text/xml
Note
(type = degree)
M.S.
Note
(type = bibliography)
Includes bibliographical references (p. 125-130)
Note
(type = statement of responsibility)
by Raghuveer Ausoori
Name
(ID = NAME-1);
(type = personal)
NamePart
(type = family)
Ausoori
NamePart
(type = given)
Raghuveer
NamePart
(type = termsOfAddress)
NamePart
(type = date)
1985-
Role
RoleTerm
(authority = RULIB);
(type = )
author
Description
DisplayForm
Raghuveer Ausoori
Name
(ID = NAME-2);
(type = personal)
NamePart
(type = family)
Bushnell
NamePart
(type = given)
Michael
Role
RoleTerm
(authority = RULIB);
(type = )
chair
Affiliation
Advisory Committee
DisplayForm
Michael Lee Bushnell
Name
(ID = NAME-3);
(type = personal)
NamePart
(type = family)
Chakraborty
NamePart
(type = given)
Tapan
Role
RoleTerm
(authority = RULIB);
(type = )
internal member
Affiliation
Advisory Committee
DisplayForm
Tapan Chakraborty
Name
(ID = NAME-4);
(type = personal)
NamePart
(type = family)
Agrawal
NamePart
(type = given)
Vishwani
Role
RoleTerm
(authority = RULIB);
(type = )
outside member
Affiliation
Advisory Committee
DisplayForm
Vishwani Agrawal
Name
(ID = NAME-5);
(type = personal)
NamePart
(type = family)
Chen
NamePart
(type = given)
Xinghao
Role
RoleTerm
(authority = RULIB);
(type = )
outside member
Affiliation
Advisory Committee
DisplayForm
Xinghao Chen
Name
(ID = NAME-1);
(type = corporate)
NamePart
Rutgers University
Role
RoleTerm
(authority = RULIB);
(type = )
degree grantor
Name
(ID = NAME-2);
(type = corporate)
NamePart
Graduate School - New Brunswick
Role
RoleTerm
(authority = RULIB);
(type = )
school
OriginInfo
DateCreated
(point = );
(qualifier = exact)
2009
DateOther
(qualifier = exact);
(type = degree)
2009-10
Place
PlaceTerm
(type = code)
xx
RelatedItem
(type = host)
TitleInfo
Title
Rutgers University Electronic Theses and Dissertations
Identifier
(type = RULIB)
ETD
RelatedItem
(type = host)
TitleInfo
Title
Graduate School - New Brunswick Electronic Theses and Dissertations
Identifier
(type = local)
rucore19991600001
Location
PhysicalLocation
(authority = marcorg);
(displayLabel = Rutgers, The State University of New Jersey)
NjNbRU
Identifier
(type = doi)
doi:10.7282/T3H70FXN
Genre
(authority = ExL-Esploro)
ETD graduate
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Rights
RightsDeclaration
(AUTHORITY = GS);
(ID = rulibRdec0006)
The author owns the copyright to this work.
Copyright
Status
Copyright protected
Notice
Note
Availability
Status
Open
Reason
Permission or license
Note
RightsHolder
(ID = PRH-1);
(type = personal)
Name
FamilyName
Ausoori
GivenName
Raghuveer
Role
Copyright Holder
RightsEvent
(AUTHORITY = rulib);
(ID = RE-1)
Type
Permission or license
Label
Place
DateTime
2009-10-01 18:01:10
Detail
AssociatedEntity
(AUTHORITY = rulib);
(ID = AE-1)
Role
Copyright holder
Name
Raghuveer Ausoori
Affiliation
Rutgers University. Graduate School - New Brunswick
AssociatedObject
(AUTHORITY = rulib);
(ID = AO-1)
Type
License
Name
Author Agreement License
Detail
I hereby grant to the Rutgers University Libraries and to my school the non-exclusive right to archive, reproduce and distribute my thesis or dissertation, in whole or in part, and/or my abstract, in whole or in part, in and from an electronic format, subject to the release date subsequently stipulated in this submittal form and approved by my school. I represent and stipulate that the thesis or dissertation and its abstract are my original work, that they do not infringe or violate any rights of others, and that I make these grants as the sole owner of the rights to my thesis or dissertation and its abstract. I represent that I have obtained written permissions, when necessary, from the owner(s) of each third party copyrighted matter to be included in my thesis or dissertation and will supply copies of such upon request by my school. I acknowledge that RU ETD and my school will not distribute my thesis or dissertation or its abstract if, in their reasonable judgment, they believe all such rights have not been secured. I acknowledge that I retain ownership rights to the copyright of my work. I also retain the right to use all or part of this thesis or dissertation in future works, such as articles or books.
RightsEvent
(AUTHORITY = rulib);
(ID = RE-2)
Type
Embargo
Label
Place
DateTime
Detail
365 days
AssociatedObject
(AUTHORITY = );
(ID = )
Type
Detail
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Technical
ContentModel
ETD
MimeType
(TYPE = file)
application/pdf
MimeType
(TYPE = container)
application/x-tar
FileSize
(UNIT = bytes)
2713600
Checksum
(METHOD = SHA1)
5d595af19880baf0d69ac770264f2f56a59ff025
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