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Electrical characteristics and stability of novel MgxZn1-xO (0 ≤ x ≤ 0.06) thin film transistors
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Ku, Chieh-Jen. Electrical characteristics and stability of novel MgxZn1-xO (0 ≤ x ≤ 0.06) thin film transistors. Retrieved from https://doi.org/doi:10.7282/T3S46QH9

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