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Evaluation of the Tauc Method for Optical Absorption Edge Determination: ZnO Thin Films as a Model System

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TypeOfResource
Text
TitleInfo
Title
Evaluation of the Tauc Method for Optical Absorption Edge Determination: ZnO Thin Films as a Model System
Name (type = personal)
NamePart (type = family)
Viezbicke
NamePart (type = given)
Brian D.
Affiliation
Materials Science and Engineering, Rutgers University
Role
RoleTerm (authority = marcrt); (type = text)
author
Name (type = personal)
NamePart (type = family)
Patel
NamePart (type = given)
Shane
Affiliation
Materials Science and Engineering, Rutgers University
Role
RoleTerm (authority = marcrt); (type = text)
author
Name (type = personal)
NamePart (type = family)
Davis
NamePart (type = given)
Benjamin E.
Affiliation
Materials Science and Engineering, Rutgers University
Role
RoleTerm (authority = marcrt); (type = text)
author
Name (type = personal)
NamePart (type = family)
Birnie
NamePart (type = given)
Dunbar P.
Affiliation
Materials Science and Engineering, Rutgers University
Role
RoleTerm (authority = marcrt); (type = text)
author
Name (authority = RutgersOrg-Department); (type = corporate)
NamePart
Materials Science and Engineering
Name (authority = RutgersOrg-School); (type = corporate)
NamePart
School of Engineering
Genre (authority = RULIB-FS)
Article, Refereed
Genre (authority = NISO JAV)
Accepted Manuscript (AM)
OriginInfo
DateCreated (encoding = w3cdtf); (keyDate = yes); (qualifier = exact)
2015
Publisher
Wiley-VCH
Abstract (type = Abstract)
One of the most frequently used methods for characterizing thin films is UV-Vis absorption. The near-edge region can be fitted to a simple expression in which the intercept gives the band-gap and the fitting exponent identifies the electronic transition as direct or indirect. (See Tauc et al., Physica Status Solidi, 1966; these are often called “Tauc” plots.) While the technique is powerful and simple, the accuracy of the fitted band-gap result is seldom stated or known. We tackle this question by refitting a large number of Tauc plots from the literature and look for trends. Nominally pure zinc oxide (ZnO) was chosen as a material with limited intrinsic deviation from stoichiometry and which has been widely studied. Our examination of the band gap values and their distribution leads to a discussion of some experimental factors that can bias the data and lead to either smaller or larger apparent values than would be expected. Finally, an easily evaluated figure-of-merit is defined that may help guide more accurate Tauc fitting. For samples with relatively sharper Tauc plot shapes, the population yields Eg (ZnO) as 3.276 +/- 0.033 eV, in good agreement with data for single crystalline material.
Language
LanguageTerm (authority = ISO 639-3:2007); (type = text)
English
PhysicalDescription
InternetMediaType
application/pdf
Extent
33 p.
Subject (authority = local)
Topic
Band gaps
Subject (authority = local)
Topic
Near-edge absorptivity ratio
Subject (authority = local)
Topic
Optical absorption
Subject (authority = LCSH)
Topic
Light absorption
Subject (authority = local)
Topic
Polycrystalline semiconductors
Subject (authority = LCSH)
Topic
Polycrystals
Subject (authority = local)
Topic
Tauc plots
Subject (authority = local)
Topic
Thin films
Subject (authority = LCSH)
Topic
Zinc oxide thin films
Subject (authority = local)
Topic
ZnO
Extension
DescriptiveEvent
Type
Citation
DateTime (encoding = w3cdtf)
2015
AssociatedObject
Name
Physica Status Solidi, B
Type
Journal
Relationship
Has part
Detail
1700-1710
Identifier (type = volume and issue)
252(8)
Reference (type = url)
https://dx.doi.org/10.1002/pssb.201552007
Extension
DescriptiveEvent
Type
Grant award
AssociatedEntity
Role
Funder
Name
National Science Foundation
AssociatedEntity
Role
Originator
Name
Manish Chhowalla
AssociatedObject
Type
Grant number
Name
0903661
Note (type = version identification)
This is the accepted version of the following article: Viezbicke, B. D., Patel, S., Davis, B. E. and Birnie, D. P. (2015), Evaluation of the Tauc method for optical absorption edge determination: ZnO thin films as a model system. Phys. Status Solidi B, 252: 1700–1710, which has been published in final form at https://dx.doi.org/10.1002/pssb.201552007.
Note (type = peerReview)
Peer reviewed
RelatedItem (type = host)
TitleInfo
Title
Birnie Dunbar Collection
Identifier (type = local)
rucore30144400001
Location
PhysicalLocation (authority = marcorg); (displayLabel = Rutgers, The State University of New Jersey)
NjNbRU
Identifier (type = doi)
doi:10.7282/T3W097T7
RelatedItem (type = is associated with)
TitleInfo
Title
Assessing Tauc plot slope quantification: ZnO thin films as a model system
Identifier (type = url)
http://dx.doi.org/10.7282/T3445QC7
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Copyright for scholarly resources published in RUcore is retained by the copyright holder. By virtue of its appearance in this open access medium, you are free to use this resource, with proper attribution, in educational and other non-commercial settings. Other uses, such as reproduction or republication, may require the permission of the copyright holder.
Copyright
Status
Copyright protected
Availability
Status
Open
Reason
Permission or license
RightsEvent
Type
Permission or license
AssociatedObject
Type
License
Name
Multiple author license v. 1
Detail
I hereby grant to Rutgers, The State University of New Jersey (Rutgers) the non-exclusive right to retain, reproduce, and distribute the deposited work (Work) in whole or in part, in and from its electronic format, without fee. This agreement does not represent a transfer of copyright to Rutgers.Rutgers may make and keep more than one copy of the Work for purposes of security, backup, preservation, and access and may migrate the Work to any medium or format for the purpose of preservation and access in the future. Rutgers will not make any alteration, other than as allowed by this agreement, to the Work.I represent and warrant to Rutgers that the Work is my original work. I also represent that the Work does not, to the best of my knowledge, infringe or violate any rights of others.I further represent and warrant that I have obtained all necessary rights to permit Rutgers to reproduce and distribute the Work and that any third-party owned content is clearly identified and acknowledged within the Work.By granting this license, I acknowledge that I have read and agreed to the terms of this agreement and all related RUcore and Rutgers policies.
RightsEvent
Type
Embargo
DateTime (point = end); (encoding = w3cdtf)
2016-03-16
Detail
Access to this PDF has been restricted at the publisher's request. It will be publicly available after March 16, 2016.
RightsHolder (type = corporate)
Name
Wiley-VCH
Role
Copyright holder
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ContentModel
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