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Analysis methods for energy dispersive X-ray diffraction patterns, U.S. Patent 6,118,850

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English
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Patent
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Materials Science and Engineering
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School of Engineering
Name (type = corporate); (authority = RutgersOrg-Department)
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Physics and Astronomy
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Electrical and Computer Engineering
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School of Arts and Sciences (SAS) (New Brunswick)
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2000
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Title
Analysis methods for energy dispersive X-ray diffraction patterns, U.S. Patent 6,118,850
Abstract (type = abstract)
Energy dispersive x-ray diffraction spectra are obtained from numerous volume elements within an object. A feature set such as a set of cepstrum coefficients is extracted from each spectrum and classified by a trained classifier such as a neural network to provide an indication of whether or not contraband such as explosives is present in the volume element. Indications for adjacent volume elements are evaluated in conjunction with one another, as by an erosion process, to suppress isolated indications and thereby suppress false alarms.
PhysicalDescription
Extent
30 p.
Name (type = personal)
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Mayo
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William E.
Affiliation
Materials Science and Engineering, Rutgers University
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author
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Kalman
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Zwi
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author
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Croft
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Mark C.
Affiliation
Physics and Astronomy, Rutgers University
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author
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Wilder
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Joseph
Affiliation
Electrical and Computer Engineering, Rutgers University
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author
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Mammone
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Richard
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Electrical and Computer Engineering, Rutgers University
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Fineberg
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Adam B
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Patents
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Croft, Mark C.
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Mammone, Richard
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NjNbRU
Identifier (type = doi)
doi:10.7282/T34170F5
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Rights

Copyright
Status
Public domain
Availability
Status
Open
Reason
Mandated by law
Publication
Status
Published
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