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Experimental and numerical study on manufacturing gallium nitride thin films in MOCVD process

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Title
Experimental and numerical study on manufacturing gallium nitride thin films in MOCVD process
Name (type = personal)
NamePart (type = family)
Jumaah
NamePart (type = given)
Omar Dhannoon
NamePart (type = date)
1983-
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Omar Dhannoon Jumaah
Role
RoleTerm (authority = RULIB)
author
Name (type = personal)
NamePart (type = family)
Jaluria
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Yogesh
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Yogesh Jaluria
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Advisory Committee
Role
RoleTerm (authority = RULIB)
chair
Name (type = personal)
NamePart (type = family)
Mazzeo
NamePart (type = given)
Aaron
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Aaron Mazzeo
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Advisory Committee
Role
RoleTerm (authority = RULIB)
internal member
Name (type = personal)
NamePart (type = family)
Shan
NamePart (type = given)
Jerry
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Jerry Shan
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Advisory Committee
Role
RoleTerm (authority = RULIB)
internal member
Name (type = personal)
NamePart (type = family)
Birnie
NamePart (type = given)
Dunbar
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Dunbar Birnie
Affiliation
Advisory Committee
Role
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outside member
Name (type = corporate)
NamePart
Rutgers University
Role
RoleTerm (authority = RULIB)
degree grantor
Name (type = corporate)
NamePart
School of Graduate Studies
Role
RoleTerm (authority = RULIB)
school
TypeOfResource
Text
Genre (authority = marcgt)
theses
OriginInfo
DateCreated (encoding = w3cdtf); (keyDate = yes); (qualifier = exact)
2019
DateOther (encoding = w3cdtf); (qualifier = exact); (type = degree)
2019-10
CopyrightDate (encoding = w3cdtf); (qualifier = exact)
2019
Language
LanguageTerm (authority = ISO 639-3:2007); (type = text)
English
Abstract (type = abstract)
Gallium nitride (GaN) thin film is an attractive material for manufacturing optoelectronic device applications due to its wide band-gap and superb optoelectronic performance. The reliability and durability of the devices depend on the quality of thin films. Metal-organic chemical vapor deposition (MOCVD) process is a common technique used to fabricate high-quality GaN thin films. The deposition rate and uniformity of thin films are manipulated by controlling operating conditions and reactor geometry configurations. In this study, the epitaxial growth of GaN thin films on sapphire substrates (AL2O3) was carried out in two commercial MOCVD systems, a vertical rotating disk MOCVD reactor, and a close-coupled showerhead MOCVD reactor. Material characterizations have been done using Atomic Force Microscopy (AFM), X-ray diffraction (XRD), Scanning Electron Microscope (SEM), and Raman scattering to examine the surface morphology and crystal quality of GaN thin films. The growth rate and uniformity of GaN thin films are simulated based on a three-dimensional computational fluid dynamics (CFD) model. Transport phenomena and chemical kinetics of the GaN growth process are performed using a reduced chemistry model, which contains 17 gas phase, and 8 surface species participating in 17 gas phase and 17 surface reactions. Numerical simulation of the single wafer and multi-wafers reactors have performed. A comprehensive study of the influence of operating variables, including rotation rate of the susceptor, susceptor temperature, inlet velocity, the reactor pressure, and precursor concentration ratio, on the GaN growth process is carried out. Operating parameters that have significant effects on the growth rate and uniformity of GaN thin films are identified. The reactor pressure and flow rate of trimethylgallium (TMG) have a significant effect on the deposition rate. A high-quality thin film is obtained when pure H2 is used as a carrier gas. The high flow rate of pure N2 gas enhances the growth of GaN thin films at high reactor pressure. However, it decreases the uniformity of the GaN thin film and promotes carbon contaminations. Thus, using an appropriate mixture of H2 and N2 as a carrier can improve the deposition rate and quality of GaN thin films. The inlet design has a significant effect on improving the reactant species utilization and increases the growth rate. The proper distance between the inlet and the susceptor aids to decrease the temperature gradient and improve the stability of the flow above the rotating susceptor.
The optimization of GaN deposition rate and uniformity in the MOCVD process have represented in a surrogate model. Surrogate-based optimization is an effective technique to alleviate expensive computation experiments with fewer sample points. The response surface from simulation data with minimum error variance estimation is generated using the Kriging method. The optimization of GaN deposition is performed as a deterministic problem, without taking into consideration the uncertain input parameters and the corresponding output response. Also, the optimization under uncertainty of design variables is considered. Multi-objective optimization using a multi-objective genetic algorithm carried out to find optimal solutions. The results reveal that the proposed optimization formulation can generate Pareto frontier of conflicting objectives, thus providing reliable trade-off solutions for decision-makers.
The optimization of GaN deposition rate and uniformity in the MOCVD process have represented in a surrogate model. Surrogate-based optimization is an effective technique to alleviate expensive computation experiments with fewer sample points. The response surface from simulation data with minimum error variance estimation is generated using the Kriging method. The optimization of GaN deposition is performed as a deterministic problem, without taking into consideration the uncertain input parameters and the corresponding output response. Also, the optimization under uncertainty of design variables is considered. Multi-objective optimization using a multi-objective genetic algorithm carried out to find optimal solutions. The results reveal that the proposed optimization formulation can generate Pareto frontier of conflicting objectives, thus providing reliable trade-off solutions for decision-makers.
Subject (authority = RUETD)
Topic
Mechanical and Aerospace Engineering
Subject (authority = LCSH)
Topic
Gallium nitride
Subject (authority = LCSH)
Topic
Metal organic chemical vapor deposition
RelatedItem (type = host)
TitleInfo
Title
Rutgers University Electronic Theses and Dissertations
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ETD_10129
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application/pdf
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text/xml
Extent
1 online resource (xv, 165 pages) : illustrations
Note (type = degree)
Ph.D.
Note (type = bibliography)
Includes bibliographical references
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School of Graduate Studies Electronic Theses and Dissertations
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rucore10001600001
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NjNbRU
Identifier (type = doi)
doi:10.7282/t3-6cxt-ph56
Genre (authority = ExL-Esploro)
ETD doctoral
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The author owns the copyright to this work.
RightsHolder (type = personal)
Name
FamilyName
jumaah
GivenName
omar
Role
Copyright Holder
RightsEvent
Type
Permission or license
DateTime (encoding = w3cdtf); (qualifier = exact); (point = start)
2019-07-24 17:12:17
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Name
omar jumaah
Role
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Affiliation
Rutgers University. School of Graduate Studies
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I hereby grant to the Rutgers University Libraries and to my school the non-exclusive right to archive, reproduce and distribute my thesis or dissertation, in whole or in part, and/or my abstract, in whole or in part, in and from an electronic format, subject to the release date subsequently stipulated in this submittal form and approved by my school. I represent and stipulate that the thesis or dissertation and its abstract are my original work, that they do not infringe or violate any rights of others, and that I make these grants as the sole owner of the rights to my thesis or dissertation and its abstract. I represent that I have obtained written permissions, when necessary, from the owner(s) of each third party copyrighted matter to be included in my thesis or dissertation and will supply copies of such upon request by my school. I acknowledge that RU ETD and my school will not distribute my thesis or dissertation or its abstract if, in their reasonable judgment, they believe all such rights have not been secured. I acknowledge that I retain ownership rights to the copyright of my work. I also retain the right to use all or part of this thesis or dissertation in future works, such as articles or books.
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Type
Embargo
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2019-10-31
DateTime (encoding = w3cdtf); (qualifier = exact); (point = end)
2021-10-30
Detail
Access to this PDF has been restricted at the author's request. It will be publicly available after October 30th, 2021.
Copyright
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Copyright protected
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Open
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Permission or license
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2019-07-29T11:45:13
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2019-07-29T11:45:13
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