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Development of a flat crystal X-ray emission spectrometer and applications of X-ray spectroscopy to the study of 3d transition metal-based metal-organic framework materials
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Solovyev, Mikhail A.. Development of a flat crystal X-ray emission spectrometer and applications of X-ray spectroscopy to the study of 3d transition metal-based metal-organic framework materials. Retrieved from https://doi.org/doi:10.7282/t3-pxx3-vv55

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TitleDevelopment of a flat crystal X-ray emission spectrometer and applications of X-ray spectroscopy to the study of 3d transition metal-based metal-organic framework materials
NameSolovyev, Mikhail A. (author); Lockard, Jenny (chair); Pavanello, Michele (member); He, Huixin (member); Sun, Chengjun (member); Rutgers University; Graduate School - Newark
Date Created2022
Other Date2022-10 (degree)
SubjectInorganic chemistry, Chemistry, Metal organic frameworks, Spectroscopy, Synchrotron X-ray spectroscopy
Extent125 pages : illustrations
DescriptionMetal Organic Frameworks (MOFs) are extended 3-dimensional structures that arecrafted by joining together metal ions/clusters with organic linkers. Specific attributes of MOFs can be tuned by varying the metal and linker composition. This tunability, together with the large surface area produced by their permanent microporosity, has shown great promise in various adsorption-based applications such as, small molecule separation, storage, and delivery. More recently MOF magnetic and electronic properties have been explored for applications such as catalysis, chemical sensing and switching. MOF utility depends on the interaction between guest molecules contained within the porous network and the framework itself. This host-guest communication, however, is often not well understood due to the complexity of the 3-dimensional structures. Traditional characterization methods have limited utility for studying such interactions in solid state materials.
This dissertation aims to expand the understanding of MOF structure and electronic properties by using X-ray spectroscopy methods to probe the host-guest interactions in the frameworks as well as their corresponding electronic structure changes. A long-range goal of this research is to develop advanced X-ray spectroscopy techniques for both ex-situ and in-situ studies of MOF systems. This is accomplished, in part, via interrogation of two specific well-known MOF systems with a variety of X-ray techniques and confirming previously known information as well as reporting on new information that can be gleaned from the interrogations. The other focus of the research is the development of two new spectrometers designed for X-ray emission studies, with improvements in the resolution and data acquisition, making the process faster and easier while providing high quality data.
NotePh.D.
NoteIncludes bibliographical references
Genretheses
Persistent URLhttps://doi.org/doi:10.7282/t3-pxx3-vv55
LanguageEnglish
CollectionGraduate School - Newark Electronic Theses and Dissertations
Organization NameRutgers, The State University of New Jersey
RightsThe author owns the copyright to this work.
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