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Piezoresponse force microscopy using adaptive contact-mode imaging

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TitleInfo
Title
Piezoresponse force microscopy using adaptive contact-mode imaging
Name (type = personal)
NamePart (type = family)
Waskar
NamePart (type = given)
Mohit
NamePart (type = date)
1993-
DisplayForm
Mohit Waskar
Role
RoleTerm (authority = RULIB)
author
Name (type = personal)
NamePart (type = family)
Zou
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Qingze
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Qingze Zou
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Advisory Committee
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chair
Name (type = personal)
NamePart (type = family)
Lee
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Howon
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Howon Lee
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Advisory Committee
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co-chair
Name (type = personal)
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Hayes
NamePart (type = given)
Robert
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Robert Hayes
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Advisory Committee
Role
RoleTerm (authority = RULIB)
co-chair
Name (type = corporate)
NamePart
Rutgers University
Role
RoleTerm (authority = RULIB)
degree grantor
Name (type = corporate)
NamePart
School of Graduate Studies
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school
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Text
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theses
OriginInfo
DateCreated (qualifier = exact)
2019
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2019-01
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2019
Place
PlaceTerm (type = code)
xx
Language
LanguageTerm (authority = ISO639-2b); (type = code)
eng
Abstract (type = abstract)
Atomic Force Microscopy (AFM) is a type of Scanning Probe Microscopy (SPM) which involves a probe tip scanning over a sample surface for obtaining data of the sample. Data acquisition is carried out by making physical contact with the surface of the sample, thus there is scope of characterizing data even beyond basic topology. Piezoresponse Force Microscopy (PFM) is just an extension of AFM imaging which is used for obtaining the piezoelectric response of the sample using the converse piezoelectric effect. Piezoelectric effect can be observed in almost all the materials around us which include biological and inorganic materials. PFM imaging is extensively used in the nanoscale characterization of ferroelectrics and its applications continue to grow. Thus, with the growing use of this technique, it is important to obtain images of high quality and at a faster rate to reduce the time required to image without affecting its accuracy. Research and experiments show that with the help of different algorithms and external control, the speed of AFM imaging can be boosted with reduced loss of data and higher accuracy. This research aims at applying existing control methodologies used in AFM imaging to the PFM imaging and analyzing the output by comparing images obtained at lower and higher speeds using different methods.
Subject (authority = RUETD)
Topic
Mechanical and Aerospace Engineering
Subject (authority = ETD-LCSH)
Topic
Atomic force microscopy
Subject (authority = ETD-LCSH)
Topic
Piezoresponse force microscopy
RelatedItem (type = host)
TitleInfo
Title
Rutgers University Electronic Theses and Dissertations
Identifier (type = RULIB)
ETD
Identifier
ETD_9481
PhysicalDescription
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electronic resource
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Extent
1 online resource (34 pages) : illustrations
Note (type = degree)
M.S.
Note (type = bibliography)
Includes bibliographical references
Note (type = statement of responsibility)
by Mohit Waskar
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TitleInfo
Title
School of Graduate Studies Electronic Theses and Dissertations
Identifier (type = local)
rucore10001600001
Location
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NjNbRU
Identifier (type = doi)
doi:10.7282/t3-01hk-8m02
Genre (authority = ExL-Esploro)
ETD graduate
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Rights

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The author owns the copyright to this work.
RightsHolder (type = personal)
Name
FamilyName
Waskar
GivenName
Mohit
Role
Copyright Holder
RightsEvent
Type
Permission or license
DateTime (encoding = w3cdtf); (qualifier = exact); (point = start)
2019-01-03 15:16:13
AssociatedEntity
Name
Mohit Waskar
Role
Copyright holder
Affiliation
Rutgers University. School of Graduate Studies
AssociatedObject
Type
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Name
Author Agreement License
Detail
I hereby grant to the Rutgers University Libraries and to my school the non-exclusive right to archive, reproduce and distribute my thesis or dissertation, in whole or in part, and/or my abstract, in whole or in part, in and from an electronic format, subject to the release date subsequently stipulated in this submittal form and approved by my school. I represent and stipulate that the thesis or dissertation and its abstract are my original work, that they do not infringe or violate any rights of others, and that I make these grants as the sole owner of the rights to my thesis or dissertation and its abstract. I represent that I have obtained written permissions, when necessary, from the owner(s) of each third party copyrighted matter to be included in my thesis or dissertation and will supply copies of such upon request by my school. I acknowledge that RU ETD and my school will not distribute my thesis or dissertation or its abstract if, in their reasonable judgment, they believe all such rights have not been secured. I acknowledge that I retain ownership rights to the copyright of my work. I also retain the right to use all or part of this thesis or dissertation in future works, such as articles or books.
Copyright
Status
Copyright protected
Availability
Status
Open
Reason
Permission or license
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Technical

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2019-01-03T19:39:59
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2019-01-03T19:39:59
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