Resource
Ion beam analysis of novel materials and devices involving silicon carbide and bismuth selenide
PDF
PDF format is widely accepted and good for printing.
PDF-1(5.56 MB)

Citation & Export
Hide

Simple citation

Xu, Can. Ion beam analysis of novel materials and devices involving silicon carbide and bismuth selenide. Retrieved from https://doi.org/doi:10.7282/T3F47R5H

Export

Statistics
Hide

Version 8.4.8
Rutgers University Libraries - Copyright ©2022